1. ......................
Author: Singh, Narinder
Library: Central Library and Information Center of Ferdowsi University of Mashhad (Khorasan Razavi)
Subject: Very large scale integration - Testing - Data processing ، Integrated circuits,، Expert systems )Computer science(,، Artificial intelligence
Classification :
TK
7874
.
S533
1987
2. Advanced simulation and test methodologies for VLSI design
Author: Russell, Gordon.
Library: Central Library and Information Center of Ferdowsi University of Mashhad (Khorasan Razavi)
Subject: Very large scale integration - Testing ، Integrated circuits
Classification :
TK
7874
.
R88
1989
3. Algorithmic and knowledge based CAD for VLSI
Author: edited by Gaynor Taylor and Gordon Russell
Library: Library of College of Science University of Tehran (Tehran)
Subject: Design and construction -- Data processing ، Integrated circuits -- Very large scale integration,Testing -- Data processing ، Integrated circuits -- Very large scale integration,، Computer-aided design,، Expert systems )Computer science(
Classification :
TK
7874
.
A416
1992
4. An artificial intelligence approach to test generation
Author: Singh, Narinder
Library: Central Library of Amirkabir University of Technology (Tehran)
Subject: Integrated circuits - Very large scale integration - Testing - Data processing , Expert systems )Computer science( , Artificial intelligence
Classification :
TK
7874
.
S533
5. An artificial intelligence approach to test generation
Author: Singh, Narinder, 6591-
Library: Central Library and Documents Center of Industrial University of Khaje Nasiredin Toosi (Tehran)
Subject: ، Integrated circuits -- Very large scale integration -- Testing -- Data processing,، Expert systems )Computer science(,، Artificial intelligence
Classification :
TK
7874
.
S533
6. An artificial intelligence approach to test generation
Author: / by Narinder Singh
Library: Tehran University, technical faculty libraries 1 (Tehran)
Subject: Integrated circuits - Very large scale integration - Testing - Data processing,Expert systems (Computer science),Artificial intelligence
Classification :
TK
7874
.
S533
1986
7. An artificial intelligence approach to test generation
Author: / by Narinder Singh
Library: Library of Campus2 Colleges of Engineering of Tehran University (Tehran)
Subject: Integrated circuits - Very large scale integration - Testing - Data processing,Expert systems (Computer science),Artificial intelligence
Classification :
TK
7874
.
S533
8. An artificial intelligence approach to test generation
Author: / by Narinder Singh
Library: Library of Campus2 Colleges of Engineering of Tehran University (Tehran)
Subject: Integrated circuits - Very large scale integration - Testing - Data processing,Expert systems (Computer science),Artificial intelligence
Classification :
TK
7874
.
S533
1986
9. An artificial intelligence approach to test generation
Author: / by Narinder Singh
Library: Tehran University, technical faculty libraries 1 (Tehran)
Subject: Integrated circuits - Very large scale integration - Testing - Data processing,Expert systems (Computer science),Artificial intelligence
Classification :
TK
7874
.
S533
10. An artificial intelligence approach to test generation
پدیدآورنده : Singh, Narinder, 6591-
موضوع : ، Integrated circuits- Very large scale integration- Testing- Data processing,، Expert systems )Computer science(,، Artificial intelligence
۲ نسخه از این کتاب در ۲ کتابخانه موجود است.
11. An artificial intelligence approach to test generation
Author: / by Narinder Singh
Library: Library of Campus2 Colleges of Engineering of Tehran University (Tehran)
Subject: Integrated circuits - Very large scale integration - Testing - Data processing,Expert systems (Computer science),Artificial intelligence
Classification :
TK
7874
.
S533
1986
12. An introduction to logic circuit testing /
Author: Parag K. Lala
Library: Center and Library of Islamic Studies in European Languages (Qom)
Subject: Digital electronics-- Testing,Electric fault location,Integrated circuits-- Very large scale integration-- Testing,Logic circuits-- Testing
13. Built-in test for VLSI
Author: / Paul H. Bardell, William H. McAnny, Jacob Savir
Library: Library of Campus2 Colleges of Engineering of Tehran University (Tehran)
Subject: Integrated circuits--Very large scale integration - Testing
Classification :
TK
7874
.
B374
1987
14. Built-in test for VLSI
Author: / Paul H. Bardell, William H. McAnny, Jacob Savir
Library: Tehran University, technical faculty libraries 1 (Tehran)
Subject: Integrated circuits--Very large scale integration - Testing
Classification :
TK
7874
.
B374
1987
15. Design & test techniques for VLSI & WSI circuits
Author: edited by R.E. Massara
Library: Central Library and Information Center of Ferdowsi University of Mashhad (Khorasan Razavi)
Subject: Very large scale integration - Design and construction ، Integrated circuits,Very large scale integratation - Testing ، Integrated circuits,Wafer-scale integration - Design and construction ، Integrated circuits,Wafer-scale integration - Testing ، Integrated circuits
Classification :
TK
7874
.
D4749
1989
16. Design & test techniques for VLSI & WSI circuits
Author: edited by R.E. Massara
Library: Central library and information center (Khorasan Razavi)
Subject: Very large scale integration -- Design and construction ، Integrated circuits,Very large scale integration -- Testing ، Integrated circuits,Wafer-scale integration -- Design and construction ، Integrated circuits,Wafer-scale integration -- Testing ، Integrated circuits
Classification :
TK
7874
.
D4749
1989
17. Design & test techniques for VLSI & WSI circuits
Author:
Library: Library of Niroo Research Institue (Tehran)
Subject: ، Integrated circuits- Very large scale integration- Design and construction,، Integrated circuits- Very large scale integration- Testing,، Integrated circuits- Wafer- scale integration- Design and construction,، Integrated circuits- Wafer- scale integration- Testing
18. Diagnostic measurements in LSI/VLSI integrated circuits production
Author: Jakubowski, Andrzej
Library: Central Library and Documents Center of Industrial University of Khaje Nasiredin Toosi (Tehran)
Subject: ، Integrated circuits- Large scale integration- Testing,، Integrated circuits- Very large scale integration- Testing
Classification :
TK
7874
.
J35
19. Digital circuit testing and testability
Author: Lala, Parag K.
Library: Central Library and Documentation Center (Kerman)
Subject: Testing ، Integrated circuits - Very large scale integration,Testing ، Digital integrated circuits,، Integrated circuits - Fault tolerance
Classification :
TK
7874
.
75
.
L35
1997
20. Digital circuit testing and testability
Author: Lala, Parag K.
Library: Central Library of Sharif University of Technology (Tehran)
Subject: ، Integrated circuits-- Very large scale integration-- Testing,، Digital integrated circuits-- Testing,، Integrated circuits-- Fault tolerance
Classification :
TK
7874
.
75
.
L35
1997
